MBJ SM-EL Quickline EL tester

Second-Hand inline MBJ SM-EL Quickline EL tester is available in Europe.

This high-speed and high-resolution inline electroluminescence inspection system is available with 20 MPixel resolution. It is a flexible system suitable for EL  inspection at the end of the production line.

The judgment of the images is done manually by operators supported by MBJ innovative defect detection software.
This system is suitable for “long edge leading” production lines and can also be used as a pre-lamination inspection system.

Technical Features

Resolution: 320 um (20 MPixel)

Camera type: 2 cooled NIR CMOS cameras mounted on a linear axis;

Module types: Non-laminated and framed crystalline modules;

Max. module sizes: 1050 x 2050 mm;

Image aquisition time: from 6 to 30 seconds;